Dr. Harold Lee currently serves as a National Security Analyst at the Johns Hopkins Applied Physics Laboratory (APL) where he uses his technical expertise to solve some of the nation’s most challenging problems. Dr. Lee’s technical expertise includes the fabrication of nanomaterials, additive manufacturing using nanomaterials, fabrication & testing of novel composites, materials for extreme thermal, chemical, & radiation environments, and organic electronic materials & devices. Prior to joining APL, Dr. Lee did stints at Sandia National Labs, Northrop Grumman, and the National Science Foundation (NSF). He received his Ph.D. in Materials Science and Engineering from Norfolk State University (NSU) under the mentorship of Dr. Sam Sun. Dr. Lee’s research has led to 50+ presentations and publications in peer-reviewed journals, at scientific conferences in both unclassified and classified domains. His unique skills and knowledge have supported fundamental research & development, the Intelligence Community, and National Security.
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